41. Algoritms and Parallel VLSI Architectures Lectures and Tutorials Presented at (Proceedings of) the International Workshop on Algoritms and Parallel VLSI Architectures Abbaye des Premontres Pont - a - Mosson. France,. June 10 - 16, 1990
Author: / Edited by Ed F. Deprettere, Alle - Jan Van Der veen
Library: Central Library and Documents Center of Tehran University (Tehran)
Subject: Parallel Processing (Electronic computers) -- Congresses,Integrated Circuits -- Very large scale integration -- Desige and construction -- Congresses,Computer algorithms --Congresses,Computer architecture -- Congresses
Classification :
QA
76
.
58
.
I57
1990
42. An artificial intellgence approach to VLSI routing
Author: Joobbani, Rostam.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Design and construction - Data processing ، Integrated circuits,، Expert systems )Computer science(
Classification :
TK
7874
.
J663
1986
43. An artificial intelligence approach to VLSI design
Author: / Thaddeus J. Kowalski
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration,Artificial intelligence,Expert systems (Computer science),Digital electronics
Classification :
TK
7874
.
K675
1985
44. An artificial intelligence approach to VLSI routing
Author: Joobbani, Rostam.
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Integrated circuits- Very large scale integration- Design and construction- Data processing,، Expert systems )Computer science(
45. An artificial intelligence approach to test generation
Author: Singh, Narinder
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing , Expert systems )Computer science( , Artificial intelligence
Classification :
TK
7874
.
S533
46. An artificial intelligence approach to test generation
Author: Singh, Narinder, 6591-
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits -- Very large scale integration -- Testing -- Data processing,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
47. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
48. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
49. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
50. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
51. An artificial intelligence approach to test generation
پدیدآورنده : Singh, Narinder, 6591-
موضوع : ، Integrated circuits- Very large scale integration- Testing- Data processing,، Expert systems )Computer science(,، Artificial intelligence
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
52. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
53. An artificial intelligence approxch to VLSI design
Author: Kowalski, Thaddeus J.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration ، Integrated circuits,، Artificial intelligence,، Expert systems )Computer science(,، Digital electronics
Classification :
TK
7874
.
K675
1985
54. An introduction to VLSI physical design
Author: Sarrafzadeh, Majid.
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Integrated circuits - Very large scale integration - Design and construction - Data processing , Computer-aided design
Classification :
TK
7874
.
75
.
S27
1996
55. An introduction to VLSI physical design
Author: / M. Sarrafzadeh, C.K. Wong
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Integrated circuits--Very large scale integration--Computer-aided design
Classification :
TK
,
7874
.
75
,.
S27
,
1996
56. An introduction to VLSI physical design
Author: Sarrafzadeh, Majid.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Integrated circuits-- Very large scale integration-- Design and construction-- Data processing,، Computer-aided design
Classification :
TK
7874
.
75
.
S27
1996
57. An introduction to VLSI physical design
Author:
Library: Central Library and Documents Center of Mazandaran University (Mazandaran)
Subject: Integrated circuits ; Very large scale integration ; Design and construction ; Data processing. ;
58. An introduction to logic circuit testing /
Author: Parag K. Lala
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Digital electronics-- Testing,Electric fault location,Integrated circuits-- Very large scale integration-- Testing,Logic circuits-- Testing
59. Analog MOS integrated circuits
پدیدآورنده :
موضوع : ، Linear integrated circuits,، Metal oxide semiconductors,، Integrated circuits-- Large scale integration
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
60. Analog MOS integrated circuits
Author:
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Linear integrated circuits,Metal oxide semiconductors,Integrated circuits - Large scale integration
Classification :
TK
7874
.
A57
